Power device dynamic and static testing equipment is a crucial tool in the semiconductor industry, used to evaluate the performance, reliability, and stability of power devices such as IGBT, MOSFET, etc. With the rapid development of power electronics technology, the application of power devices in new energy vehicles, wind power generation, photovoltaic power generation, motor drive and other fields is becoming increasingly widespread, and the requirements for their performance are also increasing. Therefore, selecting appropriate dynamic and static testing equipment is of great significance for ensuring the quality and reliability of power devices. This article will provide a detailed introduction to the types, functions, and applications of dynamic and static testing equipment for power devices.

1、 Dynamic testing equipment for power devices

Dynamic testing equipment is mainly used to measure the dynamic parameters of power devices during the switching process, such as switching time, switching loss, gate charge, reverse recovery time, etc. These parameters are crucial for evaluating the performance of power devices in high-frequency applications.

1. Dynamic testing system for semiconductor power devices

The dynamic testing system for semiconductor power devices usually consists of high-voltage power supply, current source, oscilloscope, data acquisition card, etc. It can simulate the switching conditions in actual work, measure key parameters such as switching speed and switching loss of power devices. For example, the dynamic testing systems produced by ITC and Tesec have a maximum voltage of 1200Vdc to 1500V and a maximum current of 200A to 300A, suitable for testing power devices of different power levels.

2. Dual pulse testing system

Double pulse testing is an important method for evaluating the switching characteristics of power devices. By applying two consecutive pulse signals to the power device, the voltage and current waveforms during the switching process are measured to analyze parameters such as switching speed and switching losses. The dual pulse testing system usually includes a high-voltage DC power supply, a pulse generator, an oscilloscope, and a data acquisition system.

3. Gate charge testing system

Gate charge is an important parameter in the switching process of power devices, which determines the switching speed and switching loss. The gate charge testing system evaluates the gate driving capability of power devices by measuring the charging and discharging process of gate charges. For example, the gate charge testing system produced by ITC can reach a maximum voltage and current of 100V and 100A, suitable for gate charge testing of various power devices.

2、 Static testing equipment for power devices

Static testing equipment is mainly used to measure the parameters of power devices under static conditions, such as breakdown voltage, threshold voltage, leakage current, conduction resistance, etc. These parameters are of great significance for evaluating the electrical performance and reliability of power devices.

1. Static testing system for semiconductor power devices

The static testing system for semiconductor power devices usually consists of a high-precision power supply, voltmeter, and ammeter, which can accurately measure the electrical characteristics of power devices under static conditions. For example, the static testing systems produced by Keysight and Agilent have high precision and resolution, capable of measuring small leakage currents and on resistance, ensuring the accuracy of test results. These systems are typically equipped with advanced software interfaces that allow users to easily set test parameters, monitor the testing process, and automatically record test results.

2. Breakdown voltage testing system

The breakdown voltage is an important parameter of power devices, which determines the maximum operating voltage of the device. The breakdown voltage testing system measures the breakdown voltage value by gradually increasing the voltage until the device breaks down. These systems typically have overcurrent and short-circuit protection functions to ensure safety during testing. In addition, some advanced breakdown voltage testing systems can also measure breakdown current and breakdown time, providing more comprehensive test results.

3. Threshold voltage testing system

The threshold voltage is the voltage value at which a power device begins to conduct, which has a significant impact on the switching characteristics and power consumption of the device. The threshold voltage testing system determines the threshold voltage of the device by measuring the leakage current at different gate voltages. These systems typically have high precision and stability, ensuring the accuracy and reliability of test results. For example, some professional threshold voltage testing systems have testing accuracy up to microvolts, making them suitable for applications with extremely high threshold voltage requirements.